TC-R2K Standard ISO12233 Digital Resolution Still Camera Test Chart
Model: TC-R2K-1X
Charts come with mounting services included?Vertical Resolution and Horizontal Resolution Auxiliary Test?Complies with the ISO 12233 Standard?Resolution wedges is up to 2000 lines
Product Details
The TC-R2K series charts are designed to measure resolution of still cameras. It contains resolution wedges up to 2000 lines per picture height. Furthermore it contains slanted edges for SFR measurements.
▌Key Features
Vertical Resolution and Horizontal Resolution Auxiliary Test
Compliant with ISO12233 standard
Resolution wedges up to 2000 lines
▌Size Option
| Size | Graphic Size | Chart Size | Type | Material |
| 0.1X | 20×35.6mm | 35×50mm | Reflective matte | Inkjet Print Paper |
| 0.2X | 40×71.1mm | 60×100mm | Reflective matte | Inkjet Print Paper |
| 0.5X | 100×177.8mm | 125×200mm | Reflective matte | Inkjet Print Paper |
| 1X | 200×355.6mm | 250×400mm | Reflective matte | Inkjet Print Paper |
| 1.5X | 300×533.3mm | 375×600mm | Reflective matte | Inkjet Print Paper |
| 2X | 400×711.1mm | 500×800mm | Reflective matte | Inkjet Print Paper |
| 3X | 600×1066.7mm | 800×1250mm | Reflective matte | Inkjet Print Paper |
| 4X | 800×1422.2mm | 1000×1600mm | Reflective matte | Inkjet Print Paper |
| 5X | 1000×1777.8mm | 1111×2000mm | Reflective matte | Inkjet Print Paper |
| 8X | 1600×2844.4mm | 2000×3200mm | Reflective matte | Inkjet Print Paper |
*1. Yanding charts come with customizable images and sizes. If the listed sizes don't meet your needs, contact sales@rdbuy.com for assistance.
*2. Yanding charts come with mounting services included. Sizes 0.5X/1X or smaller are mounted on 5mm thick board, while 2X/4X or larger (excluding 8X)are mounted on 4mm thick aluminum composite panel.
▌Product Display
| F&C | used for camera framing and focus Settings |
| H | used for visual resolution analysis (judged by special software or human eyes displayed on the monitor) |
| S | horizontal and vertical resolution limit and visual "sharpness" are measured (according to loss of contrast at high frequencies |
| O | used for aliasing measurement · Pattern |
| G | used for viewing image details and sharpening |
| M | used for scanning linear measurement |
| N | used to check the artifacts caused by image compression |
| E | used to see the ladder of linear imaging |
| L | used for SFR measurements with high contrast, requiring software analysis |
| P | used for SFR measurements with low contrast |
| Q | used for focusing and resolution measurement in all image directions |