TC-R4K Enhanced ISO12233 Test Chart (up to 4000 pph)
Model: TC-R4K-1X
Charts come with mounting services included?Vertical Resolution and Horizontal Resolution Auxiliary Test?Compliant with ISO12233 standard?Resolution wedges up to 4000 lines
Product Details
Yanding R4K chart is designed to measure resolution of still cameras. It conforms to the ISO-12233 standard and contains hyperbolic wedges up to 4000 lines per picture height. Furthermore it contains slanted-edge patterns used to measure sharpness.
▌Key Features
Vertical Resolution and Horizontal Resolution Auxiliary Test
Compliant with ISO12233 standard
Resolution wedges up to 4000 lines
▌Size Option
| Size | Graphic Size | Chart Size | Type | Material |
| 0.1X | 20×35.6mm | 35×50mm | Reflective Matte | Inkjet Print Paper |
| 0.2X | 40×71.1mm | 60×100mm | Reflective Matte | Inkjet Print Paper |
| 0.5X | 100×177.8mm | 125×200mm | Reflective Matte | Inkjet Print Paper |
| 1X | 200×355.6mm | 250×400mm | Reflective Matte | Inkjet Print Paper |
| 1.5X | 300×533.3mm | 375×600mm | Reflective Matte | Inkjet Print Paper |
| 2X | 400×711.1mm | 500×800mm | Reflective Matte | Inkjet Print Paper |
| 3X | 600×1066.7mm | 800×1250mm | Reflective Matte | Inkjet Print Paper |
| 4X | 800×1422.2mm | 1000×1600mm | Reflective Matte | Inkjet Print Paper |
| 5X | 1000×1777.8mm | 1111×2000mm | Reflective Matte | Inkjet Print Paper |
| 8X | 1600×2844.4mm | 2000×3200mm | Reflective Matte | Inkjet Print Paper |
*1. Yanding charts come with customizable images and sizes. If the listed sizes don't meet your needs, contact sales@rdbuy.com for assistance.
*2. Yanding charts come with mounting services included. Sizes 0.5X/1X or smaller are mounted on 5mm thick board, while 2X/4X or larger (excluding 8X)are mounted on 4mm thick aluminum composite panel.
▌Product Display
| F&C | Used for camera framing and focus Settings |
| H | Used for visual resolution analysis (judged by special software or human eyes displayed on the monitor) |
| S | Horizontal and vertical resolution limit and visual "sharpness" are measured (according to loss of contrast at high frequencies |
| O | Used for aliasing measurement · Pattern |
| G | Used for viewing image details and sharpening |
| M | Used for scanning linear measurement |
| N | Used to check the artifacts caused by image compression |
| E | Used to see the ladder of linear imaging |
| L | Used for SFR measurements with high contrast, requiring software analysis |
| P | Used for SFR measurements with low contrast |
| Q | Used for focusing and resolution measurement in all image directions |